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http://hdl.handle.net/123456789/11123Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | UniKL MITEC | - |
| dc.date.accessioned | 2015-10-05T18:12:00Z | - |
| dc.date.available | 2015-10-05T18:12:00Z | - |
| dc.date.issued | 2015-10-06 | - |
| dc.identifier.uri | http://localhost/xmlui/handle/123456789/11123 | - |
| dc.language.iso | en | en_US |
| dc.subject | JQD 31303 | en_US |
| dc.title | Fundamentals of inspection technology | en_US |
| Appears in Collections: | Past Year Exam Paper-MITEC-Diploma-2015-January | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JQD 31303-Fundamental of inspection technology.pdf | 114.71 kB | Adobe PDF | View/Open Request a copy |
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