Browsing by Title

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 17057 to 17076 of 17545 < previous   next >
Issue DateTitleAuthor(s)
2007Wafer Defects Inspection Using Image Pattern Recognition TechniquesM.Fauzi A.Hassan; M.Amir Abas; P. Boursier; L. Pierre
21-Mar-2012WAN TechnologyMIIT
29-Aug-2012WAN TechnologyMIIT
7-Sep-2012WAN TechnologyMIIT
25-Mar-2013WAN TechnologyMIIT
31-Jul-2013WAN TechnologyMIIT
11-Apr-2014WAN TechnologyMIIT
25-Aug-2014WAN TechnologyMIIT
23-Mar-2015WAN TechnologyMIIT
20-Aug-2015WAN TechnologyMIIT
26-Oct-2015WAN TechnologyMIIT
31-Mar-2016WAN TechnologyMIIT
19-Sep-2017WAN TechnologyMIIT
3-Jun-2018WAN TechnologyMIIT
19-Feb-2018WAN TechnologyMIIT
24-Apr-2014WaqafUniKL BiS
26-Nov-2014WaqafUniKL BIS
7-May-2015WaqafUniKL BIS
12-Nov-2015WaqafUniKL BIS