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Investigation of Scribing Quality Defect of Thin Film Solar Cell Using Machine Vision

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dc.contributor.author R Shuaimi
dc.contributor.author R C Ismail
dc.contributor.author M N Hazwan Hadzir
dc.contributor.author M N M Isa
dc.contributor.author A B Jambek
dc.date.accessioned 2021-08-11T05:45:46Z
dc.date.available 2021-08-11T05:45:46Z
dc.date.issued 2020
dc.identifier.citation Shuaimi, R., Ismail, R.C., Hazwan Hadzir, M.N., Isa, M.N.M., Jambek, A.B. Investigation of Scribing Quality Defect of Thin Film Solar Cell Using Machine Vision (2020) IOP Conference Series: Materials Science and Engineering, 932 (1), art. no. 012060, DOI: 10.1088/1757-899X/932/1/012060 en_US
dc.identifier.uri http://hdl.handle.net/123456789/25077
dc.description This article is index by Scopus en_US
dc.description.abstract Laser micromachining provide significant effect in thin film solar industrial field especially in determining cell efficiency of each panels. However, there is an issue in determining scribing failure or defect on solar module. This research aims to investigate the defects of laser micromachining process in thin film solar module in manufacturing fields. Machine vision inspection system is used as inspection tools and to investigate the defect of laser micromachining in thin film solar cells. As a result, two major defects is define which is scribe line quality and scribe line position defects in every scribe line. By identifying the defect cause by laser micromachining through machine vision, quality control plan can be taken together to prevent reoccurrence. en_US
dc.publisher IOP Conference Series: Materials Science and Engineering en_US
dc.title Investigation of Scribing Quality Defect of Thin Film Solar Cell Using Machine Vision en_US
dc.conference.year 2020 en_US


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